Seminars are free, but space is limited. To reserve your space, please register online. Seminars typically last one hour, but could go longer. Seminars will alternate between two rooms. There is no limit to the number of seminars you can attend, but you need to preregister.
08:30 – 09:30 AM Topic: Applications for Telemetry in the Automotive Industry
Description: Applications for Telemetry in the Automotive Industry
Speaker: Ralph Shoberg Sponsor: PCB LOAD & TORQUE, INC.
About the Speaker: Ralph S. Shoberg , Technical Director, PCB Load & Torque, Inc., has 30 years of industry experience in the threaded fastener tightening process, telemetry systems, as well as load and torque sensors.
Ralph Shoberg has been granted numerous U.S. and international patents for transducer and instrumentation inventions, and helped create the first electronic strain gage transducer based monitor and control system for automated fastener assembly. He is a frequent lecturer on the design and analysis of bolted joints, has contributed to a number of threaded fastener handbooks, and is a frequent contributor to fastener industry-based periodicals.
Taking full advantage of his fastening technology knowledge, Shoberg developed the 6-component road load wheel force transducer giving this transducer a competitive advantage in the market. This has earned him several patents for multi-axis transducers.
Shoberg holds a BSME from the University of Michigan, is a registered Professional Engineer in the State of Michigan, and an active supporter of the Industrial Fasteners Institute and the Bolting Technology Council. He is also an active supporter of the Industrial Advisors Board at Lake State University in Michigan, a group that seeks to ensure that the engineering department produces graduates with skills relevant to today and tomorrow’s workplace.
09:30 – 10:30 AM Topic: Systems for Hybrid Development and Production testing. Description: NH Research with Electronic Loads.
Speaker: Mike Nolan Sponsor: Micro-Sales
About the Speaker: Mike Nolan of NH Research
10:30 – 11:30 AM Topic: Built In Self-Test for Switching (BIRST)
Description: Improve confidence in your test system using built in self-test to select
PXI switching modules.
Speaker: Bob Stasonis Sponsor: EQS Systems
About the Speaker: Bob Stasonis is the Sales & Marketing Director for Pickering Interfaces. He has written numerous papers and articles on the subject of Electronics Test. Over the last 30 years, Bob has held Technical, Sales & Marketing positions with Pickering Interfaces, Teradyne, GenRad, and Schlumberger. Bob is on the Board of Directors and past President of the PXI Systems Alliance, Board Member for the LXI Consortium, and the VP of Marketing for the American Society of Test Engineers.
11:30 AM – 12:30 PM Topic: Trends For High Speed & High Channel Count Digital
Data Recorders
Description: Current and future trends in Digital Data Recorders (DDR).
Speaker: Sam Herceg Sponsor: TMS, INC.
About the Speaker: Sam Herceg, Vice-President of DaqScribe Solutions brings years of experience in the field of data acquisition and data recording.
12:00 – 01:00 PM Topic: Developing a BMS Test System in PXI
Description: The move to a more “green” lifestyle, electric vehicles are clearly becoming a
growing part of the automotive scene.
Speaker: Bob Stasonis Sponsor: EQS Systems
About the Speaker: Bob Stasonis is the Sales & Marketing Director for Pickering Interfaces. He has written numerous papers and articles on the subject of Electronics Test. Over the last 30 years, Bob has held Technical, Sales & Marketing positions with Pickering Interfaces, Teradyne, GenRad, and Schlumberger. Bob is on the Board of Directors and past President of the PXI Systems Alliance, Board Member for the LXI Consortium, and the VP of Marketing for the American Society of Test Engineers.
01:00 – 02:00 PM Topic: Fact, Fiction, and Myth of digital storage scope
specifications
Description: Fact, Fiction, and Myth of digital storage scope specifications
Speaker: Charlie Rumschlag Sponsor: Agilent Technologies
About the Speaker: Charlie Rumschlag brings 25 years experience with Hewlett-Packard and Agilent in roles from Field Engineer, Digital Applications specialist, to various manager roles.
02:00 – 03:00 PM Topic: How to take Valid Data on Purpose and be able to prove it!
Description: Measurement Engineering: The Unified Approach of Peter K. Stein
Speaker: Paul Morgan Sponsor: IPETRONIK, Inc
About the Speaker: Paul Morgan, president and Co-owner of Engineered Measurement Systems (EMS), has 32 years of experience in Measurement Engineering and 30 years designing Precision Torque Transducers (patentee in this field) and state-of-the-art Torque Calibration Systems.
Paul has been employed at Marposs Guages, Lebow Associates, Key Transducers and Engineered Measurement Systems. Paul is a Disciple of Peter K. Stein’s Measurement Engineering Principles and his Unified Approach.
03:00 – 04:00 PM Topic: Fatigue Properties of Random Vibration with Various Kurtosis Levels
Description: Effects of increased Kurtosis (non-Gaussian Random Vibration) with respect to fatigue.
Speaker: John Van Baren Sponsor: Stress Analysis
About the Speaker: John Van Baren is the President of Vibration Research, which he founded in 1995. John is a registered Professional Engineer (State of Michigan) and his experience includes 30 plus years in the environmental test industry. He has designed shaker systems, shaker amplifiers, and shaker controllers. John was a pioneer in the application of time history replication on electrodynamic shakers. Currently, John and the Vibration Research team are developing the commercial application of non-Gaussian random vibration, by controlling Kurtosis. The trick is to get the non-Gaussian distribution into the product’s resonances. This requires VRC’s patented kurtosion™ algorithm. John will present the latest research results in a measurement process whereby increased kurtosis is used to accelerate the fatigue rate on a resonant beam.
Seminar Synopsis
08:30 – 09:30 AM
Applications for Telemetry in the Automotive Industry
09:30 – 10:30 AM
Systems for Hybrid Development and Production testing.
10:30 – 11:30 AM
Built In Self Test for Switching - Sponsored by EQS Systems and presented by Bob Stasonis
Verification and diagnosis of complex switching operation in a test system has always been an issue, especially in the PXI platform. This is usually because of the added cost required and the loss of real estate on the relatively small size of PXI modules. The need to ensure that the switching system is functioning within parameters is a challenge.
For this reason, Pickering Interfaces has announced that it is introducing built in self test to select models of their PXI switching modules. This feature is called BIRST™, or Built-In Relay Self Test. This presentation will discuss how BIRST can improve confidence in your test system.
11:30 AM – 12:30 PM
Trends For High Speed & High Channel Count Digital Data Recorders. Current and future trends in Digital Data Recorders (DDR).
12:00 – 01:00 PM
Developing a BMS Test System in PXI. As the developed world attempts to move to a more “green” lifestyle, electric vehicles are clearly becoming a growing part of the automotive scene. They promise low or no emissions, conceivably low cost of fuel from the power grid, yet they will deliver us safely to and from work and shopping.
But their design is a paradigm shift for the Auto Industry – new drive systems, technologies… and test plans. These vehicles are bringing new test and validation challenges to the industry as the electronics content of the vehicles grows.
The auto industry has embraced the use of Lithium Ion Batteries for most future Hybrids and Plug-in Hybrids. This battery design requires a carefully designed charging system to provide long life and safety; which means that one of the major challenges to be tackled in electric vehicles concerns the effective testing of the Battery Management System (BMS) – the electronics that manage the state of the battery storing the high levels of energy required to propel the vehicle.
To aid in the testing of the BMS, DMC Engineering & Software Services and Pickering Interfaces have collaborated to help provide a solution to BMS testing for a major manufacturer, based on PXI modules that emulate the battery systems. In this presentation, we will discuss some of the tests that must be performed and why. We’ll also show how PXI was utilized and why it was a perfect solution to a complex problem.
01:00 – 02:00 PM
Fact, Fiction, and Myth of digital storage scope specifications
02:00 – 03:00 PM
How to take Valid Data on Purpose and be able to prove it! The Unified Approach of Peter K. Stein
03:00 – 04:00 PM
Fatigue Properties of Random Vibration with Various Kurtosis Levels. Effects of increased Kurtosis (non-Gaussian Random Vibration) with respect to fatigue
